New Proposals
Last modified: 2010-02-08
Microfocus X-ray Spectroscopy Beamline
The beamline is intended for high-resolution microfocus spectroscopy on samples in the energy range 3.5 - 25 keV. The beamline will facilitate resonant inelastic scattering (RIXS), non-resonant inelastic X-ray scattering (NIXS), resonant Raman spectroscopy (RRS), X-Ray Raman scattering (XRS), X-ray emission spectroscopy (XES), and high-resolution XANES/high-energy-resolution fluorescence-detected absorption (HERFD) spectroscopy.
Photon energy range
3.5-25 keV
Source
In-vacuum undulator
Monochromator
Heat-load monochromator with interchangeable Si (111) and Si (311) crystals, retractable high-resolution four-bounce post-monochromator with several sets of crystals
Energy resolution
ΔE/E ~ 10
-4 (Si 111), ~ 10
-5 (Si 311), ~ 10
-6 (high-resolution monochromator)
Spot size
~150 x 300 µm
2 (v x h)
Microfocus ~1x1 µm
2 using KB mirrors
Polarization
Linear (circular with phase retarders)
Equipment
X-ray fluorescence spectrometer with five analyzer-crystals, rotatable to facilitate measurements at various momentum-transfer. Conventional and high-sensitivity fluorescence detectors. Sample chamber for
in-situ measurements. Cryostat for measurements down to ~10 K.
Contact person
Sergei Butorin, Physics and Astronomy, Uppsala University
Last modified: 2010-02-15
X-ray Photon Correlation Spectroscopy
X-ray Photon Correlation Spectroscopy (XPCS) beamline at the 3GeV ring at MAX IV will be world
leading thanks to outstanding specifications of the synchrotron source concerning emittance and
brilliance. The low emittance results in an increase in the beam coherence with at least one order
in magnitude. This leads to a significant improvement of the contrast in the experiment enabling
studies of weakly scattering processes and systems, complex geometries and sample environments
and smaller beam/sample sizes.
In XPCS the partial coherence of the X-ray beam is utilised to study dynamics in time domain by
following the intensity fluctuation of the scattered light. The intensity-intensity autocorrelation
function calculated from the scattering is directly related to the intermediate scattering function
S(Q,t) reflecting the dynamics in the material. XPCS provides information on mesoscopic dynamics
(~10
-3 – 1 Å
-1) over large time scales (10
-8-10
3 s),
a region not accessible by any other technique. Examples of research areas that can be addressed
are: systems with a heterogeneous microstructure and/or dynamics, polymers, non-Newtonian fluids,
colloids, liquid crystals, capillary waves polymer surfaces and of thin polymer films, protein
and bio-membrane dynamics, charge density waves, and dynamic critical phenomena. Thus the user
community is expected to include researchers from physics, chemistry, biotechnology, and biology.
A co-location of XPCS beamline with a coherent imaging/diffraction station could be of high
interest forming a critical mass for exploitation of coherent X-ray scattering techniques at MAX IV.
Guiding beamline specifications:
Photon energy
5-12 keV
Source
undulator (possibly long in-vacuum)
Spot size
10-20 µm
Optics
Coherence preserving
Contact persons
Aleksandar Matic, Chalmers University of Technology
Yngve Cerenius, MAX-lab
