Proposed Hard X-ray Beamlines
Last modified: 2010-02-01
High-Throughput Macromolecular Crystallography Beamline
This beamline will be a world class facility for challenging macromolecular crystallography work allowing structure determinations of e.g. membrane proteins, viruses and large assemblies. Macromolecular crystallography is the most important structure determination method allowing the structural biology community to determine the molecular basis for biological functions. This gives important input to the full span from fundamental life science research to pharmaceutical industry.
The beamline will be highly automated to allow high-throughput screening and data collection. The beamline will have XAFS capability allowing optimal use of anomalous signals for phasing but also to give complementary structural information. There will also be equipment for microspectrometry (e.g. UV/Vis) for complementary spectroscopic information. The beamline will be fully energy tunable and also allows work with small crystals though it will not be optimal for crystals below 20 µm. The beamline optics will allow work with an unfocused beam for use with larger crystals (full beam size of the order of 0.5 mm). As an option a fixed energy side station could be built using a diamond monochromator upstream of the optical elements of the high-throughput station. For ease of use this would require two undulators but this allows an additional station, at a relatively low cost, that could be used e.g. for sample screening.
Photon energy range
Rapidly tunable within 5 – 25 keV
Source
In-vacuum undulator
Optics
Liquid nitrogen cooled double crystal monochromator. Focusing by a set of KB mirrors. Optional configuration with unfocused beam to be able to work with larger sized crystals.
Beam at sample
Variable focus 20 - 100 µm with an option of unfocused beam that would suit crystals larger than 100 µm.
Experiment equipment
UV/Vis microspectrometry, set-up for XAFS
Contact persons
Thomas Ursby, MAX-lab &
Marjolein Thunnissen, Molecular Biophysics, Lund University
Last modified: 2010-02-03
Microfocus Beamline for Macromolecular Crystallography
Very intense and focused beams for Macromolecular Crystallography are a necessity for large complexes
but also for macromolecules of normal size for which only small crystals can be grown. This is frequently
the case with material that is difficult to express in large quantities, but also with membrane proteins
or other complex materials. Working with micrometer sized crystals is more challenging and will require
more work optimizing the data collection set-up and strategy. Nevertheless, this implies high throughput
methods since in some cases a very large number of crystals will have to be screened and used due to the
short crystal life time and possibly varying crystal quality. The capability to study small samples is an
area in which MAX IV will be highly competitive and can be a world-leading facility. This beamline will
take advantage of the ultra-low emittance of MAX IV giving the possibility to work with 1 um beam with high
flux and reasonable divergence due to the ultra-low emittance of the MAX IV 3 GeV ring. This will allow
optimal data quality from 1 µm crystals but also allow to probe the best parts of larger crystals.
Complementary information from XAFS and spectroscopy is desirable and it will therefore be available at
the beamline, though it will be difficult to obtain good quality signals from the smallest crystals.
The beamline will extend outside the normal energy range of macromolecular crystallography beamlines by reaching
up to 25 keV. There are studies indicating that the radiation damage will be reduced for microcrystals at these energies.
Photon energy range:
Rapidly tunable within 5 – 25 keV.
Source:
In-vacuum undulator
Optics:
Liquid nitrogen cooled double crystal monochromator with an optional multilayer monochromator. Depending on available
mirror quality the focusing could be achieved e.g. by a double KB set of mirrors for full tunability or with one set
of KB mirrors and possibly using compound refractive lenses for the smallest focus sizes.
Beam at sample:
Beam size 1 µm, possibly the focus will be tunable between 10 and 1 µm. Fully energy tunable.
Experiment equipment:
UV/Vis microspectrometry, set-up for XAFS
Contact persons
Thomas Ursby, MAX-lab &
Marjolein Thunnissen, Molecular Biophysics, Lund University
Last modified: 2010-02-18
Two Nanofocus Beamlines (NANO-1 & NANO-2)
MAX IV nanobeamlines features.
|
NANO-1 |
NANO-2 |
Spatial resolution
2 hutches |
10 nm – 100 nm
100 nm - 1 µm |
50 nm – 300 nm
300 nm - 1 µm |
Energy resolution (ΔE/E) |
0.01 - and pink beam |
0.01 - and pink beam |
Energy range |
5 – 40 keV |
5 - 40 keV |
Insertion device |
In-vacuum undulator |
In-vacuum undulator |
Nano-hutch |
Discrete energies |
Discrete energies |
Micro/nano hutch |
Rapid energy scans |
Discrete energies |
Main fields |
Biology, biomedical, nano-biointerfaces, nano-safety, environmental, nanotechnology |
Materials & information technology, energy research, high pressure, geology, cosmic dust, micro- and nano-fluidics |
Techniques |
XRI: 2D/3D full field
XRF/ XAS: raster probe
XAS (EXAFS,NEXAFS) |
XRD: single crystal & raster probe
Diffraction tomography
SAXS/GISAXS: raster probe
XRF: raster probe |
Abbreviations
XRD: X-Ray Diffraction
XRF: X-Ray Fluorescence
TOM: Tomography
CXDI: Coherent X-Ray Diffraction Imaging
SAXS: Small-Angle X-Ray Scattering
GISAXS: Grazing Incidence Small-Angle X-ray Scattering
XRI: X-Ray Imaging
XAS: X-Ray Absorption Spectroscopy
NEXAFS: Near Edge X-Ray Absorption Spectroscopy,
EXAFS: Extended X-Ray Absorption Spectroscopy.
Contact person
Åke Kvick, MAX-lab
Last modified: 2010-02-03
Multipurpose SAXS/ WAXS Beamline
An
undulator based beamline for small angle X-ray scattering (SAXS) experiments
with simultaneous wide angle X-ray scattering WAXS capacity. The unique low emittance
on the MAX IV 3 GeV ring will permit a design where a small X-ray spot size can be
combined with a very small divergence. It permits keeping a small spot size on the
sample while extending the sample to detector distance to be able to measure very
small scattering angles.
Source
In-vacuum undulator
Energy Range
5 – 30 keV
Spot size
Variable focus down to 20 µm
The SAXS set-up will be of a pinhole camera type where the sample to detector distance can be
varied to up to 10 m. A separate detector system for simultaneous WAXS measurements will be
mounted next to the sample. The continuous and tunable energy will allow anomalous SAXS (ASAXS).
There will be possibilities for windowless measurements which are essential for weakly scattering samples.
The experimental set-up will be equipped with a generous amount of different sample environments
including temperature control, flow, stop flow and shear cells. The set up will permit the use
of an additional goniostat for grazing incidence SAXS (GISAXS) measurements.
It could be considered to be using this type of beamline also for
X-ray Photon Correlation
Spectroscopy experiments.
Contact person
Yngve Cerenius, MAX-lab
Ulf Olsson, Physical Chemistry 1, Lund University
Last modified: 2010-02-03
X-ray Diffraction Beamline
X-ray diffraction on powders and single crystals require the highest angular resolutions to
resolve overlapping peaks for space-group symmetry determination, as well as extremely high
flux densities to obtain accurate intensities of weak satellite reflections from e.g.
aperiodic crystal structures. Surface and thin-film diffraction studies greatly benefit
from micro-focused high-brilliance X-ray beams. It is therefore proposed to construct a
combined beamline with facilities for the following type of experiments:
Ultra-high resolution X-ray powder diffraction
Time-resolved high-resolution X-ray powder diffraction
High-resolution X-ray single-crystal diffraction
Micro-focus thin-film and surface X-ray diffraction
X-ray reflectivity measurements
Grazing-incidence small angle X-ray scattering
The beamline should be based on a high brilliance undulator source, providing the means for
focusing X-ray beams on micrometer sized single-crystals, or for performing grazing-incidence
measurements in surface and thin-film research. The undulator source combined with a stable
monochromator also constitutes the ultimate photon source for advanced powder diffraction
experiments. Thus, the beamline will be equipped with three experimental stations: A powder
diffractometer (PD), a single-crystal (SC) diffractometer, and a surface diffractometer (SD).
Pre-aligned individual focusing optics will be used for fast change between experimental techniques.
Energy (wavelength) range |
5 -30 keV (0.4 - 2.5 Å) |
Photon source |
In-vacuum undulator |
Monochromator |
Double crystal monochromator with Si(111) and Si(311) crystals. |
Optics |
KB-mirrors for focusing |
Polarization |
Linear |
Spot size on sample |
PD: 1 x 0.5 mm2
SC: down to 5 x 5 µm2
SD: down to 5 x 5 µm2 |
Equipment |
PD end station:
Powder diffractometer with analyzer crystal detectors and fast strip detector.
SC end station:
Single-crystal diffractometer with large and fast area detector.
SD end station:
Heavy-load diffractometer with large and fast area detector. |
Contact person
Jeppe Christensen, MAX-lab
Last modified: 2010-02-03
Tomography Beamline
Non-destructive imaging in 2 or 3 dimensions has shown its usefulness at synchrotron sources for a very wide range of materials, ranging from metals, rocks, and ceramics to soft tissues. The high degree of coherence of the X-ray beam at the MAX IV facility could be utilized for phase contrast imaging. The design of the beamline and end station will permit a large range of imaging methods in 2 and 3 dimensions. High resolution absorption microtomography and phase contrast enhanced microtomography is expected to be standard experimental techniques of the beamline but the possibility to add other experimental techniques such as X-ray Fluorescence Computed Tomography or Coherent Diffraction Imaging in order to obtain also chemical and structural information must be carefully investigated.
The beamline should be based on a superconducting wiggler source, with an acceptance angle of 1 * 0.1 mrad, providing competitive photon flux levels in the energy range 10 - 100 keV. The number of optical components should be kept to a minimum to ensure best possible beam quality but there will be a double crystal monochromator placed as close to the source as possible so it can accept the full 1 mrad wide fan of wiggler radiation. There will be a white or pink beam option for high flux application (e.g. for fast in situ experiments).
The experimental set-up will consist of a high resolution area detector combined with a high-precision sample manipulator. The distance between detector and manipulator can be varied over several meters allowing not only different types of sample environments, imaging systems or other types of detectors, but also utilizing the
coherence effects of the X-ray beam.
Contact person
Yngve Cerenius, MAX-lab
Last modified: 2010-02-03
High Energy Photoemission (HIKE)
Photoemission using high photon and kinetic energies, often referred to as HAXPES (Hard X-ray PhotoElectron Spectroscopy), is emerging as a technique of great value for materials science, both in fundamental and applied research. This HAXPES beamline will offer versatility in sample environment, focussing and energy resolution, depending upon the demands of the users. Two endstations are envisioned: one for studies under UHV conditions, offering standard preparation tools such as sputtering and evaporation etc.; and another for studies of gaseous or outgassing samples, such as volatile liquids, or experiments at ambient pressure. The beamline will use a high-resolution post-monochromator, which will allow continuous choice of excitation energy, for resonant studies. A high flux mode, using only the heat load monochromator, will also be available.
Photon energy range
2-15 keV
Source
In-vacuum undulator
Monochromator
Si (111) heatload monochromator, retractable high-resolution
post-monochromator (asymmetric cut 4-bounce monochromator with several sets of crystals to cover full energy range). Energy resolution below 100 meV over the full energy range.
Polarization
Circular polarization using λ/4-plate (hν>4 keV); linear polarization in any plane by combining two λ/4-plates.
Spot size
UHV endstation ~1x1 µm2 using KB mirrors.
High ambient pressure endstation ~30x200 µm2.
Equipment
UHV endstation – High-resolution photoelectron spectrometer, 0-10 keV, with optional spin detector. He discharge lamp for off-line tests. XRF detector. Preparation chamber with standard sample prepaparation equipment (sputtering, LEED, evaporators etc.).
High ambient pressure endstation – High-resolution photoelectron spectrometer, 0-10 keV, allowing high ambient pressures. XRF detector
Contact person
Gunnar Öhrwall, MAX-lab
Last modified: 2010-02-10
XAFS Spectroscopy Beamline
This beamline will facilitate bulk-XAFS spectroscopy and micro-XAFS spectroscopy divided
at two endstations. This high flux undulator based beamline will offer measurements on
highly diluted samples in sub-ppm range on systems in catalysis, environmental, geological, biochemical
and materials sciences. The scanning capabilities of the monochromator will allow fast
and complete EXAFS energy scans with time resolution in seconds, and also short XANES
scans in the millisecond time scale. Microfocus XAFS combined with XRF element mapping,
as well as fluorescence yield measurements will be important beamline techniques.
Photon energy range
4-30 keV
Source
In-vacuum undulator
Monochromator
Cryogenically cooled DCM with in vacuum interchangeable Si (111) and Si(311) crystals.
Spot size
Bulk XAFS endstation ~1x1 mm2.
Microfocus endsatation <1x1 µm2 using KB mirrors.
Equipment
Sample chamber for in-situ measurements, compatible for measurements at ambient pressure, vacuum and high pressure experiments. Cryostat for measurements down to 10 K and oven for experiments at high temperatures. Detectors for XAFS measurements, XRF element mapping and total electron yield measurements.
Contact person
Katarina Norén, MAX-lab
Last modified: 2010-02-10
Environmental Science Beamline
The Environmental Science beamline will be dedicated to XAFS spectroscopy measurements within the tender X-ray
energy range 1-4 keV, covering the K adsorption edges from Mg to Ca. In order to accommodate interest from a
broad research community including environmental, earth and planetary sciences, and biological, catalysis and materials
research, this beamline will offer versatility in sample environment and focusing of the beam. Two endstations
are envisioned, one for bulk XAFS spectroscopy and another for microfocus XAFS spectroscopy and X-ray
fluorescence (XRF) element mapping.
Efforts are already made to build the bulk XAFS spectroscopy part of this beamline at the 1.5 GeV MAX II ring,
and to move it and upgrade it with the microfocus endstation at the 1.5 GeV ring at the MAX IV facility.
Photon energy range
1-4 keV
Source
In-vacuum undulator at the 1.5 GeV ring
Monochromator
Water cooled DCM with three pairs of in vacuum interchangeable crystals: KTP (011), InSb (111) and Si (111).
Spot size
Bulk XAFS endstation ~1x1 mm2
Microfocus endsatation ~1x1 µm2 using KB mirrors
Equipment
Sample chamber for in-situ measurements, compatible for measurements at ambient pressure, vacuum and high
pressure experiments. Cryostat for measurements down to 10 K and oven for experiments at high temperature.
Detectors for XAFS measurements, XRF element mapping and total electron yield measurements.
Contact person
Katarina Norén, MAX-lab
Last modified: 2010-02-18
Material Science Beamline
The Materials Science researcher has many different techniques in the toolbox, such as X-ray absorption
spectroscopy (XAS) and X-ray diffraction (XRD) techniques. This beamline is dedicated to high-energy XAS and XRD experiments, and is complementary to the MAX IV undulator based beamlines operating below 30 keV.
It is anticipated that the beamline will be used as a workhorse for several fundamental experimental techniques:
High-energy XAS
Time-resolved XAS
Pair-distribution function studies
High-energy powder diffraction experiments
Electron density studies
In-situ x-ray diffraction through thick-walled vessels
High-pressure and extreme conditions research
High-energy thin-film and surface diffraction
Studies of magnetic materials
A super-conducting wiggler source should be used to obtain world-wide competitive photon flux levels in the energy
range 30 - 100 keV, and a versatile optical scheme will provide stable beams on both the XAS and XRD experimental stations.
Energy (wavelength) range |
XAS: 30 - 70 keV (0.18 - 0.6 Å)
XRD: 30 -100 keV (0.12 - 0.6 Å) |
Photon source |
Super-conducting multi-pole wiggler |
Monochromators |
XAS: Double-crystal monochromator in Bragg mode. Si(111), Si(311) and Si(511) crystals.
XRD: Double-crystal monochromator in Laue mode. Bendable Si(111) crystals for focusing. |
Optics |
XAS: Collimation mirror before monochromator and KB mirrors for focusing.
XRD: Compound-refractive lenses for focusing. |
Polarization |
Linear (circular with phase retarder plates) |
Spot size on sample |
Non-focused: 4 x 40 mm2
Focused: 10 x 10 µm2 |
Equipment |
XAS end station: High-load sample goniometer and translation system.
Integrated high-vacuum compatible sample chamber with cryostat, heating elements, gas ports and
connections to ion chambers and multi-element fluorescence detectors. High-resolution spectrometer
for x-ray emission spectroscopy.
XRD end station: High-resolution/heavy-load diffractometer. Large area detectors optimized for 30 -100 keV. |
Contact person
Stefan Carlson, MAX-lab
