Spectroscopy endstationThe spectroscopy endstation is used for high resolution XPS and NEXAFS measurements on clean surfaces and surface adsorbates under ultra high vacuum (UHV) conditions. It consists of separate analyser and preparation chambers accessible via a long-travel manipulator. The preparation chamber includes the usual equipment for preparation and characterization of surfaces (Ar+ ion sputter gun, LEED optics, mass spectrometer), and is connected to a gas-inlet system that allows the storage of up to 4 gases simultaneously, plus argon. The hemispherical electron energy analyser (SCIENTA SES200) is the main instrument used for photoelectron spectroscopy. The sample drain current can also be used for obtaining electron yield NEXAFS. (Aug 10) Updated instructions on how to operate the beamline can be found in this pdf document here |
Prep chamberThe preparation chamber has a maximum of 9 front ports (2-3/4" or CF40) available for installation of user equipment, as illustrated on the picture below. Please note that port 4 and 7 are close to the beamline, and consequently cannot house equipment (such as transfer arms) that stick out too far. Port 8 and 9 point to the centre of the chamber at only 44 mm above the base flange. In addition there is also an upward pointing 4-1/2" (CF63) port on the backside of the chamber. The distance from the port edges to the centre of the chamber is 185 mm (port 6: 230 mm), the height of the chamber (green line) is 224 mm. |
Scienta SES200 analyserThe analyser is, of course, set up for ordinary photoemission spectra, but can also operate in constant final state (CFS) mode to measure NEXAFS; constant initial state (CIS) to record f.i. resonant photoemission spectra; and can be run in angle resolved mode to record ARPES spectra. In "add dimension" mode consecutive sweeps of a spectrum can be stored individually such that time dependence can be monitored f.i. as a function of heating, beam exposure or gas exposure. Due to the spherical symmetry of the analyser a straight entrance slit will be imaged onto a curved line at the detector, with a radius which is half that of the
analyzer. Since the detector in the non-angle resolved mode is integrating the signals along one pixel line for each energy channel, this curvature gives a
contribution to the energy broadening. For relatively wide slits (> 1 mm) the curvature can be neglected, but for narrower slits it can be more significant. In order to eliminate this effect, some of the entrance slits are curved with the appropriate radius to produce straight lines at the detector. The resolution of the analyser can be calculated from the pass energy and slit width using: |
Manipulator and sample mountingThe 600 mm travel OMNIAX manipulator can be fitted with two cryostats. The default insert is the LN2 crysostat, which has 4 large power connector feedthroughs (max 20 A each), and two thermocouple feedthroughs: both with 2 pairs of K type (chromel-alumel) spade connectors. A feedthrough with a single pair of C type (tungsten-rhenium) spades is available, but no longer mounted on the cryostat. Both cryostats terminate in a copper cylinder with an M6 threaded hole in the centre. You can fit your own sampleholder directly here (advised: max 10 cm length), or also use our piece "A", which has two holes of 3 mm diameter, spaced 6.5 mm centre-to-centre. For crystals with a groove, mounting piece "B" is often used in addition (see schematic example).
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