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Last modified: 2011-02-17

BEAMLINES AT MAX I

Beamline short info
Experimental techniques available
Energy or wavelength range
Home page

31

Scanning photoelectron microscopy

15 - 150 eV

41

Angular resolved photoemission

15 - 200 eV

 

52

Angular resolved photoemission, atomic and molecular spectroscopy, luminescence

5 - 30 eV

 

73

Infrared high-resolution spectroscopy and spectromicroscopy

12000 - 10 cm-1

BEAMLINES AT MAX II

Beamline short info
Experimental techniques available
Energy or wavelength range
Home page

I311

XPS, XAS, PEEM

30 - 1500 eV

I411

XPS, XAS, coincidence spectroscopy

40 - 1500 eV

I511-1

XPS, XAS, XES

50 - 1500 eV

I511-3

XAS, XES

50 - 1500 eV

D611

Time resolved X-ray diffraction

2 - 10 keV

I711

Small molecule crystallography, powder diffraction

0.95 - 1.4 Å

I811
 

EXAFS
Surface, interface and thin-film crystallography

2.4 - 20 keV

I911-1

Presently test station, quasi-fixed wavelength

1.2 Å

I911-2

Macromolecular crystallography, fixed wavelength

1.04 Å

I911-3

Macromolecular crystallography including MAD and SAD

0.7 - 2.0 Å

I911-4

SAXS, fixed wavelength

0.91 Å

I911-5

Macromolecular crystallography, fixed wavelength

0.91 Å

D1011 Circular dichroism, XPS, XAS 40 - 1500 eV

I1011

Circular dichroism, XAS

200 - 2000 eV

 

BEAMLINES AT MAX III

I3 Angular- and spin- resolved photoemission, atomic and molecular spectroscopy, luminescence 5 - 50 eV
I4 Angular resolved photoemission
13 - 200 eV